The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2014
Filed:
Nov. 04, 2011
Calvin J. Bittner, Saint Albans, VT (US);
Peter Feldmann, New York, NY (US);
Richard D. Kimmel, Wappingers Falls, NY (US);
Tong LI, Austin, TX (US);
Ali Sadigh, Irvine, CA (US);
David W. Winston, Asheville, NC (US);
Calvin J. Bittner, Saint Albans, VT (US);
Peter Feldmann, New York, NY (US);
Richard D. Kimmel, Wappingers Falls, NY (US);
Tong Li, Austin, TX (US);
Ali Sadigh, Irvine, CA (US);
David W. Winston, Asheville, NC (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
An on-demand table model for semiconductor device evaluation is provided. A method of providing on-demand table models for semiconductor device evaluation, includes measuring one or more measurement values of an instance of a semiconductor device. The method further includes providing, by a processor, a table model of the instance for the semiconductor device evaluation upon receiving a request for the semiconductor device evaluation. The method further includes generating a table entry in the table model for the one or more measurement values, the table entry including one or more evaluation values of an evaluation function for the instance.