The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 2014

Filed:

Jan. 12, 2012
Applicant:

Chiu-hao Cheng, New Taipei, TW;

Inventor:

Chiu-Hao Cheng, New Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01); G01R 31/317 (2006.01); G01R 31/319 (2006.01); G01R 13/02 (2006.01); G05B 19/042 (2006.01); H04L 7/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31726 (2013.01); G01R 31/31922 (2013.01); G01R 13/2018 (2013.01); H04L 7/0012 (2013.01); G01R 13/0254 (2013.01); G05B 19/0426 (2013.01);
Abstract

In a structure and a method of data synchronization for multi measuring apparatuses, the multi measuring apparatuses link together to expand channels. One of those apparatuses is a master control measuring apparatus, and others are slave measuring apparatus. The master measuring apparatus can output synchronous signal to the slave measuring apparatuses. The slave measuring apparatus can retrieve the synchronous signal as a mark of data synchronization, and the synchronous signal and the marks are further stored in a memory. All the data and marks stored in the memory of the measuring apparatuses are transferred to a processing platform. By the software installed in the processing platform, the data wave form length of the master control measuring apparatus and slave measuring apparatus can be adjusted to the same, and the problem caused by the clock error of the measuring apparatus can be solved as well.


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