The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 2014

Filed:

Jan. 19, 2010
Applicants:

Geping Liu, Sunnyvale, CA (US);

Kundan Chand, Cupertino, CA (US);

Zhe LI, Sunnyvale, CA (US);

Wui Hung Moo, Perak, MY;

Joseph Boon Hock Kho, Sarawak, MY;

Inventors:

Geping Liu, Sunnyvale, CA (US);

Kundan Chand, Cupertino, CA (US);

Zhe Li, Sunnyvale, CA (US);

Wui Hung Moo, Perak, MY;

Joseph Boon Hock Kho, Sarawak, MY;

Assignee:

Altera Corporation, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A computer implemented method for determining a timing variation for an edge of a waveform under simultaneous switching noise (SSN) conditions is provided. The method includes characterizing an impact of mutual inductive relationships on a pin while the pin is at a quiet state and characterizing a signal edge applied to the pin. The signal edge can be characterized by the slew rate in one embodiment. A voltage change related to a curve characterizing the impact of mutual inductive relationships is identified and the voltage change is applied to a curve characterizing an impact of SSN on the signal edge. The method includes calculating a timing variation correlated to the voltage change applied to the curve characterizing the impact of SSN on the signal edge and presenting the calculated timing variation.


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