The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 2014

Filed:

Oct. 20, 2009
Applicants:

Frank Dennerlein, Forchheim, DE;

Frédéric Noo, Midvale, TN (US);

Inventors:

Frank Dennerlein, Forchheim, DE;

Frédéric Noo, Midvale, TN (US);

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
A61B 6/03 (2013.01);
Abstract

At least one embodiment of the invention relates to a method for the reconstruction of image data from an examined object, using measuring data, wherein the measuring data were first recorded during a relative movement between a radiation source on a computer tomography system and the examined object. In at least one embodiment, the image reconstruction is based on a back projection of the filtered measuring data. During the back projection, a back projection weight that depends on the respective image point is used and the power with which the back projection weight is used is selectable.


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