The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 2014

Filed:

Jan. 29, 2013
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventor:

Hiroyasu Ishii, Kanagawa, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2006.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
G01N 23/04 (2013.01); A61B 6/5264 (2013.01); A61B 6/484 (2013.01); A61B 6/488 (2013.01); A61B 6/5235 (2013.01); A61B 6/4291 (2013.01);
Abstract

In each of a first phase shift differential image produced in the absence of a subject in preliminary imaging and a second phase shift differential image produced in the presence of the subject in main imaging, boundaries, at each of which a value changes from π/2 to −π/2 or from −π/2 to π/2, are determined. First and second staircase data in each of which a value changes by π or −π when crossing each of the boundaries in a predetermined direction is produced. The first and second staircase data is added to the first and second phase shift differential images to produce first and second added phase shift differential image, respectively. The first added phase shift differential image is subtracted from the second added phase shift differential image to produce a corrected phase shift differential image.


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