The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 2014

Filed:

Dec. 10, 2012
Applicant:

Netgear, Inc., San Jose, CA (US);

Inventors:

Joseph Amalan Arul Emmanuel, Cupertino, CA (US);

Jonathan M. Hummel, Indio, CA (US);

Assignee:

Netgear, Inc., San Jose, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04B 7/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems, processes, and structures provide near-field transmit power measurement for MIMO wireless devices (DUT), such as for any of product development, product verification, and/or production testing. A test signal, such as comprising a pulse train signal, is provided to a MIMO device under test (DUT), wherein portions of the test signal controllably steered and sequentially transmitted from each of the device antennas, to one or more test antennas that are positioned in close proximity to the MIMO DUT. The near-field power of the received test signals is measured, to quickly and efficiently determine if one or more data streams of the MIMO DUT has a problem.


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