The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2014
Filed:
Oct. 30, 2013
Marvell International Ltd., Hamilton, BM;
Xueshi Yang, Cupertino, CA (US);
Yu-Yao Chang, Sunnyvale, CA (US);
Michael Madden, Mountain View, CA (US);
Zining Wu, Los Altos, CA (US);
Marvell International Ltd., Hamilton, BM;
Abstract
Methods, systems and computer program products for performing hybrid defect detection are disclosed. In some implementations, an apparatus includes a signal module to process data signals corresponding to data on a storage medium to generate signal samples. The apparatus includes a first defect detector to identify a first portion of the signal samples, determine a number of the signal samples in the first portion that are associated with abnormal signal characteristics, and generate a first output based on the number of the signal samples in the first portion that are associated with abnormal signal characteristics. The apparatus includes a second defect detector to identify a second portion of the signal samples different from the first portion, and generate a second output based on a correlation between data bits and signal samples in the second portion.