The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8823949 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 02, 2014

Filed:

Oct. 12, 2011
Applicants:

Chih-kuang Chang, New Taipei, TW;

Wen-dong Liu, Shenzhen, CN;

Inventors:

Chih-Kuang Chang, New Taipei, TW;

Wen-Dong Liu, Shenzhen, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
G01B 11/24 (2013.01);
Abstract

A measurement apparatus includes a pedestal, a supporting tray, a first movable base, a first measuring assembly, a second movable base, a second measuring assembly, a third movable base, a third measuring assembly, and a console. The supporting tray is rotationally fixed in the pedestal and can be rotated to position a workpiece at different angles to ensure that images of all portions and surfaces needing to be measured can be captured.


Find Patent Forward Citations

Chang, Chih-Kuang. (2014). Measurement apparatus (U.S. Patent No. 8823949). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8823949

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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