The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2014
Filed:
Oct. 12, 2011
Applicants:
Chih-kuang Chang, New Taipei, TW;
Wen-dong Liu, Shenzhen, CN;
Inventors:
Chih-Kuang Chang, New Taipei, TW;
Wen-Dong Liu, Shenzhen, CN;
Assignees:
Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Shenzhen, CN;
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
G01B 11/24 (2013.01);
Abstract
A measurement apparatus includes a pedestal, a supporting tray, a first movable base, a first measuring assembly, a second movable base, a second measuring assembly, a third movable base, a third measuring assembly, and a console. The supporting tray is rotationally fixed in the pedestal and can be rotated to position a workpiece at different angles to ensure that images of all portions and surfaces needing to be measured can be captured.