The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2014
Filed:
Aug. 02, 2012
Rolf Beck, Esslingen, DE;
Rolf Beck, Esslingen, DE;
Carl Zeiss OIM GmbH, Wangen, DE;
Abstract
An apparatus for optically inspecting a test specimen has an at least partly reflective surface including a camera having a number of pixels and an illumination device having a multiplicity of spatially distributed light sources. A workpiece receptacle serves for positioning the test specimen relative to the illumination device and the camera, such that light from the light sources is reflected by the surface to the camera. An evaluation and control unit generates a series of different illumination patterns on the surface, wherein in the course of the series different light sources are switched on. An individual light origin region is determined on the basis of the images recorded by the camera for at least one pixel, whereby the region represents a spatial distribution of individual light contributions generated by the light sources via the surface on the at least one pixel.