The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 2014

Filed:

Sep. 22, 2011
Applicants:

Yasushi Ichizawa, Musashino, JP;

Naomichi Chida, Musashino, JP;

Minoru Akutsu, Musashino, JP;

Inventors:

Yasushi Ichizawa, Musashino, JP;

Naomichi Chida, Musashino, JP;

Minoru Akutsu, Musashino, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/225 (2006.01); H04N 7/18 (2006.01); G01N 21/89 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8903 (2013.01); H04N 5/225 (2013.01); H04N 7/18 (2013.01);
Abstract

An apparatus for measuring the position and shape of a pattern formed on a sheet includes a sheet on which a pattern is formed, a camera holding mechanism that is disposed perpendicular to a transportation direction of the sheet, at least one camera that is disposed such that the camera is movable in a longitudinal direction of the camera holding mechanism, and an image processing computer that processes an image picked up by the at least one camera. In the measuring apparatus, when calibration is performed, calibration is performed with reference to a picked up image of the coating pattern and a picked up image of a reference body for calibration.


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