The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2014
Filed:
Jan. 31, 2012
Applicants:
J. David Schell, Austin, TX (US);
Sena E. R. Janky, Sammamish, WA (US);
Inventors:
J. David Schell, Austin, TX (US);
Sena E. R. Janky, Sammamish, WA (US);
Assignee:
Fluke Corporation, Everett, WA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G08B 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A display method and apparatus provides an easy to interpret presentation of multiple channel data, in the form of columns where the height of the column represents the relative measurement. A threshold line provides an indication of whether the measurement is above or below the threshold. Greater detail and numeric measurement values can be displayed for individual channels while the multiple channel display is in view.