The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 2014

Filed:

Mar. 08, 2012
Applicants:

Akinori Saeki, Suita, JP;

Shuhei Seki, Suita, JP;

Inventors:

Akinori Saeki, Suita, JP;

Shuhei Seki, Suita, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2014.01); H01L 31/00 (2006.01); G01N 27/00 (2006.01); H01L 51/00 (2006.01); H01L 31/0256 (2006.01);
U.S. Cl.
CPC ...
G01N 27/00 (2013.01); H01L 51/0092 (2013.01); H01L 51/0064 (2013.01); G01R 31/26 (2013.01); G01R 31/2605 (2013.01); H01L 31/0256 (2013.01);
Abstract

An evaluation systemaccording to the present invention includes: a light sourcefor exposing a pulsed white light or a pulsed laser light onto a sample; a microwave exposing and detecting unitfor exposing a microwave onto an organic materialand for detecting the intensity of the microwave which has passed through the organic material; a microwave passing unitfor making the microwave pass through the organic materiala plurality of times; and an evaluating unitfor evaluating the photoelectric conversion characteristics of the sample based on the intensity of the microwave which has passed through the organic materialwhen the pulsed white light or the pulsed laser light is exposed and the intensity of the microwave which has passed through the organic materialwhen the pulsed white light or the pulsed laser light is not exposed.


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