The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2014
Filed:
Oct. 17, 2011
Bryan Bolt, Beaverton, OR (US);
Eric W. Strid, Portland, OR (US);
Kazuki Negishi, Beaverton, OR (US);
Steve Harris, Hillsboro, OR (US);
Bryan Bolt, Beaverton, OR (US);
Eric W. Strid, Portland, OR (US);
Kazuki Negishi, Beaverton, OR (US);
Steve Harris, Hillsboro, OR (US);
Cascade Micotech, Inc., Beaverton, OR (US);
Abstract
Systems and methods for simultaneous optical testing of a plurality of devices under test. These systems and methods may include the use of an optical probe assembly that includes a power supply structure that is configured to provide an electric current to a plurality of devices under test (DUTs) and an optical collection structure that is configured to simultaneously collect electromagnetic radiation that may be produced by the plurality of DUTs and to provide the collected electromagnetic radiation to one or more optical detection devices. The systems and methods also may include the use of the optical probe assembly in an optical probe system to evaluate one or more performance parameters of each of the plurality of DUTs.