The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 2014

Filed:

Apr. 07, 2010
Applicants:

Yu Sun, Toronto, CA;

Changai RU, Toronto, CA;

Yong Zhang, Toronto, CA;

Inventors:

Yu Sun, Toronto, CA;

Changai Ru, Toronto, CA;

Yong Zhang, Toronto, CA;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/26 (2006.01); H01J 37/20 (2006.01); H01J 37/28 (2006.01); H01J 37/18 (2006.01);
U.S. Cl.
CPC ...
H01J 37/20 (2013.01); H01J 2237/204 (2013.01); H01J 2237/208 (2013.01); H01J 37/28 (2013.01); H01J 2237/2008 (2013.01); H01J 2237/206 (2013.01); H01J 37/185 (2013.01); H01J 2237/2007 (2013.01);
Abstract

The present invention relates to a carrier device for transporting one or more manipulators into a vacuum specimen chamber of an electron microscope, characterized in that the carrier device comprises: (i) a platform having securing means for detachably securing the one or more manipulators to the platform, and (ii) electrical connectors secured to the platform for the electrical connection of the one or more manipulators. The present invention also relates to a method for transporting the carrier device into the vacuum specimen chamber of the electron microscope without altering the vacuum of the vacuum specimen chamber comprising transporting the carrier device of the invention through the specimen exchange chamber of the electron microscope and into the vacuum specimen chamber.


Find Patent Forward Citations

Loading…