The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2014
Filed:
Aug. 28, 2012
Andreas Steinmueller, Wettenberg, DE;
Andreas Steinmueller, Wettenberg, DE;
Oculus Optikgeraete GmbH, , DE;
Abstract
An ophthalmological analysis instrument for measuring a topography of a surface of an eye includes a projection apparatus and a monitoring apparatus. The projection apparatus has at least one illumination device and an aperture device. The illumination device has a first light source, which can emit light in a predominantly monochromatic spectrum, it being possible to image an image pattern on a surface of an eye by the aperture device. Images of the imaged image pattern being recordable by the monitoring apparatus, and a topography of the surface of the being derivable from the images, wherein the illumination device has at least one further light source, which can emit polychromatic light in a predominantly visible spectrum.