The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2014
Filed:
Aug. 26, 2011
Masahiro Miki, Tokai, JP;
Yoshiaki Nagashima, Hitachi, JP;
Masao Endou, Kitaibaraki, JP;
Kojiro Kodaira, Hitachinaka, JP;
Mitsuru Odakura, Hitachi, JP;
Masahiro Miki, Tokai, JP;
Yoshiaki Nagashima, Hitachi, JP;
Masao Endou, Kitaibaraki, JP;
Kojiro Kodaira, Hitachinaka, JP;
Mitsuru Odakura, Hitachi, JP;
Hitachi-GE Nuclear Energy, Ltd., Ibaraki, JP;
Abstract
A nondestructive inspection apparatus includes a pair of guided wave sensors disposed on an outer surface of a piping and a guided wave inspection device connected to the pair of guided wave sensors which, outputs a transmitting signal for propagating a guided wave to the guided wave sensors, and obtains a receiving signal by receiving a propagated signal by the guided wave sensors. An inspection-result storage device stores the guided wave as a digitized signal of the received wave and an inspection-result diagnostic device performs arithmetic processing of judging whether or not a signal associated with a defect exists.