The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2014

Filed:

Nov. 19, 2012
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Ivan Matthew Milman, Austin, TX (US);

Martin Oberhofer, Boeblingen, DE;

Sushain Pandit, Austin, TX (US);

Calvin Stacy Powers, Durham, NC (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 21/00 (2013.01); G06F 21/57 (2013.01); H04L 29/06 (2006.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01); H04L 63/1433 (2013.01);
Abstract

Gap analysis is performed on security capabilities of a computer system compared to a desired or targeted security model according to one or more security requirement by providing a data structure of security capabilities of a computer system under analysis, wherein each capability is classified in a formal security capability reference model with a mean having a set of attributes and a goal; determining the security capabilities of the deployed system-under-analysis; matching the security capabilities of the deployed system-under-analysis with the security capabilities defined in the data structure; determining one or more gaps in security capabilities between the deployed system and a security reference model goal; and displaying the gaps to a user in a report.


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