The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 26, 2014
Filed:
Jul. 30, 2010
Stephen Eric Zingelewicz, Scotia, NY (US);
Branden James Moore, Latham, NY (US);
Stephen Eric Zingelewicz, Scotia, NY (US);
Branden James Moore, Latham, NY (US);
General Electric Company, Niskayuna, NY (US);
Abstract
A method and system for evaluating a system are described. A parameter space comprising one or more parameters corresponding to the system and/or an application executed on the system is defined. Additionally, one or more search functions for selecting a parameter from the parameter space to evaluate a desired characteristic of the system are determined. Further, at least one parameter from the parameter space is selected using the one or more search functions and the application is executed using the selected parameter. Subsequently, the execution of the application is monitored and metrics associated with the application are recorded. The method further includes iteratively selecting another parameter from the parameter space based on the recorded metrics and executing the application using the selected another parameter.