The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2014

Filed:

Jun. 28, 2012
Applicants:

Madhusudan Kalluri, Sunnyvale, CA (US);

Fan Zhang, Milpitas, CA (US);

Bruce Wilson, San Jose, CA (US);

Johnson Yen, Fremont, CA (US);

Inventors:

Madhusudan Kalluri, Sunnyvale, CA (US);

Fan Zhang, Milpitas, CA (US);

Bruce Wilson, San Jose, CA (US);

Johnson Yen, Fremont, CA (US);

Assignee:

LSI Corporation, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention is related to systems and methods for adaptive parameter modification in a data processing system. As one example, a system is disclosed that includes a filter calibration circuit that is operable to calculate an updated coefficient for a filter circuit using a data set pair including a converged output and a corresponding data set.


Find Patent Forward Citations

Kalluri, Madhusudan. (2014). Systems and methods for enhanced accuracy npml calibration (U.S. Patent No. 8819519). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8819519

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…