The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2014

Filed:

Aug. 31, 2012
Applicants:

Masahiro Yanagida, Yokohama, JP;

Hiroyuki Fujimoto, Kawasaki, JP;

Inventors:

Masahiro Yanagida, Yokohama, JP;

Hiroyuki Fujimoto, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G11C 29/16 (2006.01); G11C 29/56 (2006.01); G11C 29/34 (2006.01); G11C 8/16 (2006.01); G11C 29/26 (2006.01);
U.S. Cl.
CPC ...
G11C 29/16 (2013.01); G11C 29/56004 (2013.01); G11C 29/34 (2013.01); G11C 8/16 (2013.01); G11C 2029/2602 (2013.01);
Abstract

An integrated circuit includes a storing unit; and a tester that executes a write and read test on the storing unit based on received test information including a pair of address and data, the tester including: a first retain unit that retains, when a write is made based on the test information, the first write address and the first write data used in the write; a first generator that generates, based on the first write address retained in the first retain unit, a first read address used for reading first read data from the first read address in the storing unit simultaneously with writing second write data to a second write address based on the test information; and a second generator that generates, based on the first write data retained in the first retain unit, an expected value of the first read data.


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