The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 26, 2014
Filed:
Dec. 30, 2011
Zhuowei LI, Redmond, WA (US);
Muthu A. K. Jagannathan, Issaquah, WA (US);
Dong Wei, Bellevue, WA (US);
Zhuowei Li, Redmond, WA (US);
Muthu A. K. Jagannathan, Issaquah, WA (US);
Dong Wei, Bellevue, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
A test system for a managed cloud computing environment may have a management system that may recruit devices in the cloud and outside the cloud to perform a test on a cloud based application. Each device may execute an agent that connects the device to several cloud services for messaging, data collection, and executable code storage. The management system may identify and gather the devices, then cause the devices to execute a test by sending commands through the messaging service. The devices may access executable code for the specific tasks of a test through the code storage service, and as the devices complete tasks for the test, the devices may publish results in the data collection service. The test system enables any type of scenario to be implemented, including operations that can only be performed inside and outside the managed cloud environment.