The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 26, 2014
Filed:
Oct. 15, 2010
Applicants:
Masataka Nagura, Yokohama, JP;
Takayuki Nagai, Machida, JP;
Kiminori Sugauchi, Yokohama, JP;
Inventors:
Assignee:
Hitachi, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01); G06F 11/07 (2006.01); H04L 29/06 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); H04L 63/1425 (2013.01); H04L 63/1416 (2013.01);
Abstract
To provide a fault analysis result classification function capable of reducing the time required to eliminate a fault in a monitoring target apparatus. The fault analysis results (fault cause candidates) obtained during the fault analysis processing are classified for the influence range of each of the fault cause candidates by analyzing which of the other fault cause candidates relate to the fault events of the apparatus abnormal state, which are used as the basis to derive the each of the fault cause candidates. Further, the classification results are displayed on a GUI.