The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2014

Filed:

Aug. 05, 2011
Applicants:

Ramesh Natarajan, Pleasantville, NY (US);

Arindam Banerjee, Roseville, MN (US);

Hanhuai Shan, St. Paul, MN (US);

Inventors:

Ramesh Natarajan, Pleasantville, NY (US);

Arindam Banerjee, Roseville, MN (US);

Hanhuai Shan, St. Paul, MN (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01); G06Q 30/00 (2012.01);
U.S. Cl.
CPC ...
G06Q 30/00 (2013.01);
Abstract

A system, method and computer program product provides for multiple imputation of missing data elements in retail data sets used for modeling and decision-support applications based on the multi-dimensional, tensor structure of the data sets, and a fast, scalable scheme is implemented that is suitable for large data sets. The method generates multiple imputations comprising a set of complete data sets each containing one of a plurality of imputed realizations for the missing data values in the original data set, so that the variability in the magnitudes of these missing data values can be captured for subsequent statistical analysis. The method is based on the multi-dimensional structure of the retail data sets incorporating tensor factorization, that in a preferred embodiment can be implemented using fast, scalable imputation methods suitable for large data sets, to obtain multiple complete data sets in which the original missing values are replaced by various imputed values.


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