The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2014

Filed:

Oct. 12, 2011
Applicants:

Georg V. Wolfe, Butler, PA (US);

William E. Schmidt, Gibsonia, PA (US);

Jeffery A. Peterson, Pittsburgh, PA (US);

Edward J. Fisher, Butler, PA (US);

Inventors:

Georg V. Wolfe, Butler, PA (US);

William E. Schmidt, Gibsonia, PA (US);

Jeffery A. Peterson, Pittsburgh, PA (US);

Edward J. Fisher, Butler, PA (US);

Assignee:

AGR International, Inc., Butler, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/02 (2006.01); G01B 11/06 (2006.01); G01N 21/90 (2006.01);
U.S. Cl.
CPC ...
G01B 11/06 (2013.01); G01N 21/90 (2013.01);
Abstract

Various embodiments are directed to systems and methods for measuring a thickness of a container. For example, a control device may receive data indicating a surface topology of the container and based on the surface topology of the container, instruct a multi-axis positioning system to position a sensor relative to a first point of the container such that: a distance from the sensor to a surface at the first point is about equal to a predetermined distance; and the sensor direction is about normal to the surface at the first point. Data indicating the thickness at the first point may be received from the sensor.


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