The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 26, 2014
Filed:
Sep. 23, 2010
Uwe Mienhardt, Korntal-Muenchingen, DE;
David Lehmann, Seewis, CH;
Uwe Mienhardt, Korntal-Muenchingen, DE;
David Lehmann, Seewis, CH;
TRUMPF Maschinen Gruesch AG, Gruesch, CH;
Abstract
A method for creating an NC program for controlling a test run for determining, optimizing and/or validating processing parameters and/or control parameters of a processing operation on a laser processing machine comprises accessing a base NC program that includes at least one contour variable for the at least one test contour to be produced in the test run and at least one decision function for value assignment of a contour parameter to the contour variable, providing a selection function for selection by an operator of a combination of input values that are characteristic of the processing operation, and creating the NC program from the base NC program by automatic execution of the at least one decision function for assigning a contour parameter to the contour variable, the contour parameter being determined based on the combination of input values.