The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2014

Filed:

Dec. 07, 2010
Applicant:

Adrian Schumacher, Munich, DE;

Inventor:

Adrian Schumacher, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A measuring device for measuring a device under test comprises a first subscriber, a second subscriber, a first virtual antenna array and a processing device. The device under test in this context is a mobile station. The first virtual antenna array comprises at least two mobile stations. The first virtual antenna array contains the device under test. The first subscriber is arranged in such a manner that it transmits signals to the first virtual antenna array. The first virtual antenna array in this context is arranged in such a manner that it transmits signals at least indirectly to the second subscriber. The processing device is designed in such a manner that it compares signals transmitted to the device under test and transmitted from the device under test.


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