The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2014

Filed:

Aug. 07, 2012
Applicants:

Long N. Phan, Somverville, MA (US);

Jonathan Lee Jesneck, Enfield, CT (US);

Sanjay Sarma, Lexington, MA (US);

Inventors:

Long N. Phan, Somverville, MA (US);

Jonathan Lee Jesneck, Enfield, CT (US);

Sanjay Sarma, Lexington, MA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and a computer program product for deriving temperature information with respect to surfaces within a scene that is imaged radiometrically. A time sequence of radiometric data is acquired in frames viewed from distinct angles. A three-dimensional structure of the scene is derived, allowing viewing angles and distances to the imaged surfaces to be inferred. Normalized surface areas of the imaged surfaces are calculated based on the inferred viewing angles and emissivities of the imaged surfaces are corrected accordingly. Corrections also account for background radiation impinging on the imaged surfaces. The radiometric data are converted to a perceptible temperature map of the imaged surfaces.


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