The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 26, 2014
Filed:
Dec. 28, 2010
Dominique Placko, Creteil, FR;
Pierre-yves Joubert, Sceaux, FR;
Alain Rivollet, Jouy en Josas, FR;
Abstract
The invention relates to a device and method for estimating defects potentially present in an object comprising an outer surface, wherein the method comprises the steps of: a) illuminating the outer surface of the object with an inductive wave field at a predetermined frequency; b) measuring an induced wave field ({right arrow over (H)}) at the outer surface of the object; c) developing from the properties of the object's material a coupling matrix T associated with a depth Z of the object from the outer surface; d) solving the matrix system to determine a vector ({right arrow over (J)}) at depth Z; e) extracting a sub-vector ({right arrow over (J)}) from the vector ({right arrow over (J)}) corresponding to a potential defect on the object at depth Z; and f) quantitatively estimating the potential defect from the sub-vector ({right arrow over (J)}) at depth Z, wherein the method is performed using a computer or processor.