The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 26, 2014
Filed:
Dec. 22, 2010
Bum-suk Lee, Cheonan-si, KR;
Eung-sang Lee, Asan-si, KR;
Gi-chang Park, Yongin-si, KR;
Jong-jin Kim, Seoul, KR;
Chan-youn Park, Seongnam-si, KR;
Bum-Suk Lee, Cheonan-si, KR;
Eung-Sang Lee, Asan-si, KR;
Gi-Chang Park, Yongin-si, KR;
Jong-Jin Kim, Seoul, KR;
Chan-Youn Park, Seongnam-si, KR;
Samsung Display Co., Ltd., , KR;
Abstract
A display panel test apparatus includes: an image pickup part which picks up an image from a target display panel; a jig including a receiving part which receives the target display panel, a fixing part which fixes the image pickup part, and an adjusting part which adjusts an image pickup angle of the image pickup part; a pattern generating part which provides the target display panel with a test pattern; a defect extracting part which analyzes test image data provided from the image pickup part using a defect extracting algorithm and extracts display defect information, where the defect extracting algorithm includes different settings corresponding to different types of display defects; and a control part which generates evaluated data corresponding to a viewing angle of the target display panel using the image pickup angle of the image pickup part and the display defect information.