The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 26, 2014
Filed:
Mar. 28, 2012
Chung-chia Kang, Tainan, TW;
Jian-ren Chen, Hsinchu County, TW;
Chih-wei Chen, New Taipei, TW;
Leii H. Chang, Hsinchu County, TW;
Chung-Chia Kang, Tainan, TW;
Jian-Ren Chen, Hsinchu County, TW;
Chih-Wei Chen, New Taipei, TW;
Leii H. Chang, Hsinchu County, TW;
Industrial Technology Research Institute, Hsinchu, TW;
Abstract
A method and a system for recognizing at least one testing image according to classes are provided, wherein each of the classes includes sample images. The method includes generating an average image of each class according to the sample images, generating a feature enhancement mask according to differences between the average images of the classes, enhancing the sample images of each class by using the feature enhancement mask to generate a plurality of enhanced sample images corresponding to each class, and training a classifier according to the enhanced sample images of each class. The method also includes enhancing the at least one testing image by using the feature enhancement mask to generate an enhanced testing image, classifying the enhanced testing image into one of the classes by using the classifier, and recognizing that the testing image belongs to the classified class. Thereby, this method can effectively recognize the testing image.