The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 26, 2014
Filed:
Mar. 26, 2012
Jannick P. Rolland, Pittsford, NY (US);
Kyle Fuerschbach, Rochester, NY (US);
Jannick P. Rolland, Pittsford, NY (US);
Kyle Fuerschbach, Rochester, NY (US);
University of Rochester, Rochester, NY (US);
Abstract
An apparatus and associated method for testing a non-symmetric (e.g., phi-polynomial) surface. The apparatus uses several simple (singlet) optical elements (e.g., an Offner null configuration) and a tilted optic under test in combination with an active optical element (e.g., actuated, deformable membrane mirror, optical phase modulator, etc.) that together form a null or quasi-null that allows for conventional null-based interferometry. This solution solves the problem of exceeding the dynamic range of a conventional interferometer when trying to test non-symmetric optical surfaces.