The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8817254 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 26, 2014

Filed:

Oct. 28, 2011
Applicants:

Charles M. Santori, Palo Alto, CA (US);

Kai-mei Fu, Palo Alto, CA (US);

Andrei Faraon, Menlo Park, CA (US);

Victor M. Acosta, San Francisco, CA (US);

Zhihong Huang, San Jose, CA (US);

Raymond G. Beausoleil, Redmond, WA (US);

Inventors:

Charles M. Santori, Palo Alto, CA (US);

Kai-Mei Fu, Palo Alto, CA (US);

Andrei Faraon, Menlo Park, CA (US);

Victor M. Acosta, San Francisco, CA (US);

Zhihong Huang, San Jose, CA (US);

Raymond G. Beausoleil, Redmond, WA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/65 (2006.01); G06N 99/00 (2010.01);
U.S. Cl.
CPC ...
G06N 99/002 (2013.01);
Abstract

A process for entangling quantum states of respective quantum systems measures electromagnetic radiation emitted from a first system and from a second system. The two systems are exposed to excitation radiation having a probability per time of producing a photon, and an interference element is coupled to receive photons from the first and second systems. The process further includes measuring a time during which the first and second systems were exposed to the excitation radiation before a photon is detected on either output channel of the interference element and applying an electromagnetic pulse that causes a relative phase shift of a portion of a quantum state of the first and second systems. Parameters of the electromagnetic pulse are selected based on measurements of the electromagnetic radiation from the first and second systems and the time measured.


Find Patent Forward Citations

Santori, Charles. (2014). Entanglement process (U.S. Patent No. 8817254). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8817254

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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