The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2014

Filed:

Feb. 04, 2013
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Genichiro Kudo, Utsunomiya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 2/435 (2006.01); B41J 2/47 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical scanning apparatus, including: a deflector including deflection surfaces and configured to deflect, by the deflection surfaces, light beams respectively emitted from light emitting portions for scanning in a main scanning direction; an imaging optical system configured to guide the light beams deflected for scanning by the deflection surfaces to a surface to be scanned; a light source including the light emitting portions arranged so as to be separated from each other in a sub-scanning direction perpendicular to the main scanning direction and an optical axis direction of the imaging optical system; and a controller configured to control the light source in such a manner that a difference between scanning start timings of the light beams at two adjacent deflection surfaces among the deflection surfaces is different from a difference between scanning start timings of the light beams at other two adjacent deflection surfaces among the deflection surfaces.


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