The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2014

Filed:

Apr. 06, 2011
Applicants:

Alain Beauchamp, Montréal, CA;

Danny Roberge, St-Bruno, CA;

Benoit Perron, Boucherville, CA;

Inventors:

Alain Beauchamp, Montréal, CA;

Danny Roberge, St-Bruno, CA;

Benoit Perron, Boucherville, CA;

Assignee:

Forensic Technology WAI, Inc., Montreal, Quebec, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 19/00 (2011.01); G06T 3/00 (2006.01); G06T 5/50 (2006.01);
U.S. Cl.
CPC ...
G06T 3/0012 (2013.01); G06T 2207/10056 (2013.01); G06T 5/50 (2013.01);
Abstract

There is provided a method for generating a 3D representation of an object, comprising: acquiring 3D topographic data representative of at least one portion of the object having a macroscopic form and microscopic features; separating the 3D topographic data into microscopic data representative of the microscopic features and macroscopic data representative of the macroscopic form; independently scaling one of the microscopic data and the macroscopic data in order to enhance the microscopic features with respect to the macroscopic form, thereby obtaining scaled topographic data; and generating a 3D image using the scaled topographic data, thereby obtaining a modified representation having enhanced microscopic features for the at least one portion of the object.


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