The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 26, 2014
Filed:
May. 09, 2012
Yutaka Hasegawa, Nagoya, JP;
Koji Shimizu, Ichinomiya, JP;
Yutaka Hasegawa, Nagoya, JP;
Koji Shimizu, Ichinomiya, JP;
Denso Corporation, Kariya, JP;
Abstract
In an environment inspection mode of a calibration system, a radar device executes a signal analysis process to calculate an eigenvalue ratio of each comparison eigenvalue. The eigenvalue ratio has a small value when a pair of eigenvalues corresponding to arrival radar waves has a strong correlation. On the other hand, the eigenvalue ratio has a large value when the eigenvalue ratio is calculated between an eigenvalue and thermal noise. When there is no eigenvalue which is not more than a reference threshold value, the radar device indicates a notice that the current environment is suitable for the calibration of the radar device. On the other hand, when there is presence of at least one eigenvalue of not more than the reference threshold value, the radar device indicates a notice that the current environment is unsuitable for the calibration of the radar device.