The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 26, 2014
Filed:
Jun. 28, 2012
Lung-fai Tuen, New Taipei, TW;
Chiu-hsien Chang, New Taipei, TW;
Lung-Fai Tuen, New Taipei, TW;
Chiu-Hsien Chang, New Taipei, TW;
Wistron Corp., New Taipei, TW;
Abstract
An ESD test method for testing an object is disclosed. The object is activated and controlled to separate from a horizontal plane by a pre-determined distance. A first discharge voltage is provided to an external metal portion of the object. A first error is determined to have or have not occurred during the operation of the object each time after the first discharge voltage is provided to the external metal portion. The object is processed to eliminate the first error and then the first discharge voltage is provided to the external metal portion when the first error occurs during the operation of the object. The first error is induced by a hardware structure of the object. The object is moved to contact with the horizontal plane and a specific action is executed when the first error has not occurred during the operation of the object.