The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2014

Filed:

Jun. 13, 2011
Applicants:

Masaki Yamanaka, Osaka, JP;

Kazushige Hotta, Osaka, JP;

Inventors:

Masaki Yamanaka, Osaka, JP;

Kazushige Hotta, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/84 (2006.01); H01L 27/12 (2006.01); H01L 29/786 (2006.01); H01L 33/00 (2010.01); H01L 27/11 (2006.01); H01L 27/092 (2006.01); G02F 1/1362 (2006.01);
U.S. Cl.
CPC ...
H01L 27/092 (2013.01); H01L 29/786 (2013.01); G02F 2001/136245 (2013.01); H01L 33/0041 (2013.01); H01L 27/1108 (2013.01); G02F 1/136204 (2013.01); H01L 29/78696 (2013.01); H01L 27/1222 (2013.01); H01L 27/11 (2013.01);
Abstract

Disclosed is a semiconductor device in which an n-channel type first thin film transistor and a p-channel type second thin film transistor are provided on the same substrate. The first thin film transistor has a first semiconductor layer (), and the second thin film transistor has a second semiconductor layer (), a third semiconductor layer (), and a fourth semiconductor layer (). The first semiconductor layer (), the second semiconductor layer (), the third semiconductor layer () and the fourth semiconductor layer () are formed of the same film, and the first and second semiconductor layers () respectively have slanted portions () positioned at respective peripheries, and main portions () made of portions other than the slanted portions. A p-type impurity is implanted into the slanted portion () of the first semiconductor layer at a concentration higher than that in the main portion () of the first semiconductor layer and that in the main portion () of the second semiconductor layer.


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