The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 26, 2014
Filed:
Oct. 10, 2012
Lifescan Scotland Limited, Inverness-shire, GB;
Marco F. Cardosi, Croy, GB;
Stephen Patrick Blythe, Inverness, GB;
Matthew Finch, Nenagh, IE;
Arlene Thompson, Inverness, GB;
Nina Antonia Naylor, San Francisco, CA (US);
Eric Jason Bailey, Oakland, CA (US);
Michael Patick Dolan, Mill Valley, CA (US);
Gretchen Anderson, Oakland, CA (US);
Lorraine Comstock, Saratoga, CA (US);
Mary McEvoy, Belmont, CA (US);
Thomas Sutton, Milan, IT;
Richard Michael Day, Duncanston, GB;
Leanne Mills, Milton of Leys, GB;
Emma Vanessa Jayne Day, Culbokie Duncanston, GB;
Christopher Philip Leach, Inverness, GB;
Lifescan Scotland Limited, Inverness, GB;
Abstract
A method and system is provided to allow for determination of substantially Hematocrit independent analyte concentration. In one example, an analyte measurement system is provided that includes a test strip and a test meter. The test strip includes a reference electrode and a working electrode, in which the working electrode is coated with a reagent layer. The test meter includes an electronic circuit and a signal processor. The electronic circuit applies a plurality of voltages to the reference electrode and the working electrode over respective durations. The signal processor is configured to determine a substantially hematocrit-independent concentration of the analyte from a plurality of current values as measured by the processor upon application of a plurality of test voltages to the reference and working electrodes over a plurality of durations interspersed with rest voltages lower than the test voltages being applied to the electrodes.