The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 26, 2014
Filed:
Oct. 13, 2009
Jyrki Laitinen, Kuusisto, FI;
Markku Ojala, Turku, FI;
Jyrki Laitinen, Kuusisto, FI;
Markku Ojala, Turku, FI;
Wallac Oy, Turku, FI;
Abstract
An optical measurement instrument includes one or more temperature sensors () arranged to measure sample well specific temperatures from sample wells (-) arranged to store samples (-) to be optically measured. A processing device () of the optical measurement instrument is arranged to correct, using a pre-determined mathematical rule, measurement results obtained by the optical measurements on the basis of the measured sample well specific temperatures. Hence, the adverse effect caused by temperature differences between different samples on the accuracy of the temperature correction of the measurement results is mitigated.