The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2014

Filed:

Nov. 08, 2006
Applicant:

Nicolai Kosche, San Francisco, CA (US);

Inventor:

Nicolai Kosche, San Francisco, CA (US);

Assignee:

Oracle America, Inc., Redwood City, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/45 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for profiling a software application may include means for operating on context-specific data and costs. The system may include a descriptor apparatus for specifying identifiers of extended address elements to be profiled and locations for storing corresponding data values. In some embodiments, a list of variables to be included in profiling may be registered with an event agent and values of the variables may be captured in response to detection of a system event. Registering variables to be profiled may involve conveying a list of the variables or a pointer to such a list to the event agent. The event agent may associate the values of the registered variables with the detected system event and may store them in an event space database. The database may be accessed by a data space profiler to identify performance bottlenecks dependent on one or more registered variable values.


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