The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2014
Filed:
Feb. 29, 2012
Ciby Mathew, Toronto, CA;
Aslam F. Nomani, Markham, CA;
Ciby Mathew, Toronto, CA;
Aslam F. Nomani, Markham, CA;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A concurrency testcase generation includes providing a concurrency testcase template for features built into a concurrency testcase generation infrastructure that requires no compilation. Through the concurrency testcase template, testers may input directives for managing activities of concurrent threads, directives for configuring timing tests by the concurrent threads, directives for configuring responses to errors by the concurrent threads, and directives for configuring logging of data for the concurrent threads. The directives for managing activities of the concurrent threads may include directives for managing creation of the concurrent threads, directives for customizing actions of each concurrent thread, directives for managing a sequence of the concurrent threads, directives for exchanging of information between the concurrent threads, and directives for configuring throughput for the concurrent threads. The inputted directives collectively define the concurrency testcase. In this manner, the testcase generation infrastructure masks the programming complexities of the features from testers.