The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2014
Filed:
Jan. 12, 2009
Claudia P. Hammet, Charlotte, NC (US);
David H. Ulmer, Huntersville, NC (US);
John Cowan, Charlotte, NC (US);
Rachel Nemecek, Charlotte, NC (US);
Edward M. Dunlap, Jr., Cramerton, NC (US);
Thomas R. Williams, Mansfield, TX (US);
Claudia P. Hammet, Charlotte, NC (US);
David H. Ulmer, Huntersville, NC (US);
John Cowan, Charlotte, NC (US);
Rachel Nemecek, Charlotte, NC (US);
Edward M. Dunlap, Jr., Cramerton, NC (US);
Thomas R. Williams, Mansfield, TX (US);
Bank of America Corporation, Charlotte, NC (US);
Abstract
Systems and methods for objective Deployment Failure risk assessments are provided, which may include fault trees. Systems and methods for the analysis of fault trees are provided as well. The risk assessments system may involve the development of a fault tree, assigning initial values and weights to the events within that fault tree, and the subsequent revision of those values and weights in an iterative fashion, including comparison to historical data. The systems for analysis may involve the assignment of well-ordered values to some events in a fault tree, and then the combination those values through the application of specialized, defined gates. The system may further involve the revision of specific gates by comparison to historical or empirical data.