The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2014
Filed:
Jan. 14, 2011
Dan E. Gutfinger, Agoura Hills, CA (US);
Fujian Qu, Sunnyvale, CA (US);
Alex Soriano, Ventura, CA (US);
Ryan Rooke, Redondo Beach, CA (US);
Yelena Nabutovsky, Sunnyvale, CA (US);
Riddhi Shah, Mountain View, CA (US);
Dan E. Gutfinger, Agoura Hills, CA (US);
Fujian Qu, Sunnyvale, CA (US);
Alex Soriano, Ventura, CA (US);
Ryan Rooke, Redondo Beach, CA (US);
Yelena Nabutovsky, Sunnyvale, CA (US);
Riddhi Shah, Mountain View, CA (US);
Pacesetter, Inc., Sylmar, CA (US);
Abstract
Various techniques are provided for use with an implantable medical device for exploiting near-field impedance/admittance. Examples include techniques for assessing heart chamber disequilibrium, detecting chamber volumes and pressures, calibrating near-field-based left atrial pressure (LAP) estimation procedures and for assessing the recovery from injury at the electrode-tissue interface. In one particular example, the implantable device assesses the degree of concordance between the left ventricle (LV) and the right ventricle (RV) by quantifying a degree of scatter between LV and RV near-field admittance values. An increase in RV admittance is indicative of RV failure, an increase in LV admittance is indicative of LV failure, and an increase in both LV and RV admittance is indicative of biventricular failure.