The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2014
Filed:
May. 03, 2011
Applicants:
Edward Brown, Iii, Honeoye Falls, NY (US);
Xiaoxing Han, Rochester, NY (US);
Inventors:
Edward Brown, III, Honeoye Falls, NY (US);
Xiaoxing Han, Rochester, NY (US);
Assignee:
University of Rochester, Rochester, NY (US);
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and system that enable the measurement of a second-harmonic-generation-forward/backward (SHG F/B) ratio from an object by performing only a single image scan using via epi-imaging using an epi-detection technique. Two simultaneous SGH images (a forward propagating SHG 'F' image and a back propagating SHG 'B' image) are generated during the single image scan. A pinhole mirror can be used to separate the F-SHG and the B-SHG, which are detected by separate detectors.