The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2014

Filed:

Mar. 26, 2007
Applicants:

Benny Lennartson, Hagersten, SE;

Lars Boncz, Stockholm, SE;

Inventors:

Benny Lennartson, Hagersten, SE;

Lars Boncz, Stockholm, SE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 1/44 (2006.01); H04B 7/02 (2006.01); H04B 7/08 (2006.01); H04B 17/00 (2006.01); H04B 7/06 (2006.01);
U.S. Cl.
CPC ...
H04B 17/0057 (2013.01); H04B 7/0822 (2013.01); H04B 17/0067 (2013.01); H04B 7/0684 (2013.01);
Abstract

The invention discloses a method () for finding differences in path loss between a plurality of RF paths between a first () and a second () transceiver in a wireless communications system (). During definedintervals of time (SACCH-SACCH), only one RF path is used to transmit from one of said transceivers to the other of said transceivers, and the receiving transceiver measures the strength of the signal received during at least a number of said intervals, thus making it possible to compare signal strength and thereby path loss between different RF paths, which in turnmakes it possible to find imperfections in one or more of said RF paths.


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