The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2014

Filed:

Aug. 24, 2012
Applicants:

Robert G. Younge, Portola Valley, CA (US);

Bhaskar S. Ramamurthy, Los Altos, CA (US);

Neal A. Tanner, Mountain View, CA (US);

Randall L. Schlesinger, San Mateo, CA (US);

Eric Udd, Fairview, OR (US);

Inventors:

Robert G. Younge, Portola Valley, CA (US);

Bhaskar S. Ramamurthy, Los Altos, CA (US);

Neal A. Tanner, Mountain View, CA (US);

Randall L. Schlesinger, San Mateo, CA (US);

Eric Udd, Fairview, OR (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 6/00 (2006.01); A61B 1/07 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for measuring bending is provided. The method includes receiving a reflected signal from a strain sensor provided on an optical fiber; determining a spectral profile of the reflected signal; and determining bending of the optical fiber based on a comparison of the spectral profile of the reflected signal with a predetermined spectral profile.


Find Patent Forward Citations

Loading…