The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2014

Filed:

Mar. 15, 2011
Applicants:

Ashok Veeraraghavan, Cambridge, MA (US);

Mohit Gupta, New York, NY (US);

Amit Agrawal, Somerville, MA (US);

Inventors:

Ashok Veeraraghavan, Cambridge, MA (US);

Mohit Gupta, New York, NY (US);

Amit Agrawal, Somerville, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/40 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0057 (2013.01); G06T 2207/10152 (2013.01); G06T 2207/20221 (2013.01);
Abstract

Depth values in a scene are measured by projecting sets of patterns on the scene, wherein each set of patterns is structured with different spatial frequency using different encoding functions. Sets of images of the scene is acquired, wherein there is one image for each pattern in each set. Depth values are determining for each pixel at corresponding locations in the sets of images. The depth values of each pixel are analyzed, and the depth value is returned if the depth values at the corresponding locations are similar. Otherwise, the depth value is marked as having an error.


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