The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2014

Filed:

Sep. 13, 2012
Applicants:

Ji Ho Chang, Gyeonggi-do, KR;

Dae Hwan Hwang, Daejeon, KR;

Jae IL Cho, Daejeon, KR;

Dong IL Han, Seoul, KR;

Jong Ho Choi, Seoul, KR;

Inventors:

Ji Ho Chang, Gyeonggi-do, KR;

Dae Hwan Hwang, Daejeon, KR;

Jae Il Cho, Daejeon, KR;

Dong Il Han, Seoul, KR;

Jong Ho Choi, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/48 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed are an apparatus and a method for extracting an edge to be used for extracting a feature point of an object in an image. The present invention proposes an image edge extracting apparatus and method that remove noise in an input image, calculate a gradient of an image in a noise-removed image, measure magnitude of the gradient, extract an edge having a maximum thickness value, and then calculate a threshold using a ratio of the extracted edge, and detect a final edge robust against noise based on the threshold.


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