The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2014
Filed:
Jan. 20, 2011
Sina Farsiu, Durham, NC (US);
Stephanie J. Chiu, Durham, NC (US);
Cynthia A. Toth, Chapel Hill, NC (US);
Joseph A. Izatt, Raleigh, NC (US);
Xiao T. LI, Cumming, GA (US);
Peter Christopher Nicholas, Durham, NC (US);
Sina Farsiu, Durham, NC (US);
Stephanie J. Chiu, Durham, NC (US);
Cynthia A. Toth, Chapel Hill, NC (US);
Joseph A. Izatt, Raleigh, NC (US);
Xiao T. Li, Cumming, GA (US);
Peter Christopher Nicholas, Durham, NC (US);
Duke University, Durham, NC (US);
Abstract
Disclosed herein are systems and method for segmentation and identification of structured features in images. According to an aspect, a method may include representing an image as a graph of nodes connected together by edges. For example, the image may be an ocular image showing layered structures or other features of the retina. The method may also include adding, to the graph, nodes adjacent to nodes along first and second sides of the graph. The added nodes may have edge weights less than the nodes along the first and second sides of the graph. Further, the method may include assigning start and end points to any of the added nodes along the first and second sides, respectively. The method may also include graph cutting between the start and end points for identifying a feature in the image.