The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2014

Filed:

Apr. 12, 2013
Applicant:

Eyep, Inc., Austin, TX (US);

Inventor:

Craig Sullender, Austin, TX (US);

Assignee:

eyeP, Inc., Austin, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/34 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/34 (2013.01); G06T 7/0081 (2013.01); G06K 9/342 (2013.01);
Abstract

Embodiments disclosed include methods and systems for assigning one or more labels to one or more segments of data received in an incoming segment to a line buffer for propagated component labeling, including preventing repeated labels in each line of the line buffer by assigning a different label for each of the one or more segments of data received in each line; labeling the incoming segment of the one or more segments of data by adopting a label of an overlapping segment on a prior received line when the overlapping segment does not overlap any other segment of data; labeling the incoming segment of the one or more segments of data by adopting a label of an overlapping segment on a prior received line when the overlapping segment overlaps more than one segment on the incoming segment when the segment is a first segment in the line buffer; and labeling the incoming segment of the one or more segments of data by adopting a label of a last overlapping segment when more than one segment overlaps the incoming segment.


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